When packaged prototypes are available, the devices will be shipped to the test house for debugging. Debugging includes the continuity and leakage test, the ATPG test and test of the different analog blocks (when available on the ASIC) at room temperature.
When the ASIC is working correctly according to the specifications, further tests will be performed on Low and High temperature.
The next stage is a full characterization of the ASIC at the corners of the voltage supply and frequency at LT, RT and HT.
During each test data log is generated of the measured values and histograms together with cpk data are send to the customer. In case of specific problems, failure analysis can be done to understand the reason of the failing.