Prototyping & Fabrication Services

IHP

Technologies

IHP offers standard 0.13 and 0.25 μm CMOS processes which provide NMOS, PMOS, isolated NMOS and passive components such as poly resistors and MIM capacitors. In addition to the standard CMOS processes different front-end-of-line options are offered.

0.25 μm CMOS process is a monolithic photonic BiCMOS technology combining 0.25 µm CMOS, high-performance npn HBTs, and full photonic device set for C/O-band with the standard Al-BEOL backend.

The BEOL backend for 0.13 μm process offers 5 thin and 2 thick metal layers (TM1: 2 μm TM2: 3 μm).

Together with a high dielectric stack this enables increased performance of the passive RF components.

Besides the Al-BEOL stack, IHP also offers the CU-BEOL stack. Using processes with Cu-Layers the following passive components can be improved compared with Al-BEOL:

  • 2 thick copper metal lines,
  • higher current handling of thin metal layers
  • higher current handling of the small vias
  • 40% higher area density of MIM capacitor

OVERVIEW

DETAILS

SG13S
Technology characteristics
Met. layer(s): 7
5 thin metal layers, 2 thick metal layers
BiPolar, CMOS devices
MIM Cap, HRES, additional MEMRES module
Available I/O: I/O digital cell library
Standard cells database supports digital (front-end, backend and mixed-signal OA) design flow
Temp. range: -40° C. / +125° C
Thin gate oxide for the 1.2 V and a thick oxide for a 3.3 V supply voltage
Special features
High performance RF technology
Application area
wireless and broadband communications
Frontend Backend tools
Cadence 6.1.8, ADS, AWR, TexEDA
Verification tools
PVS (Cadence)/Calibre (Siemens)
Parasitic extraction tools
ORC (Cadence)
Place route tools
Innovus (Cadence)
Libraries
Analog/ Standard Cell and IO digital libraries
Turnaround time
6 months
SG13G2
Technology characteristics
Met. layer(s): 7
5 thin metal layers, 2 thick metal layers
BiPolar, CMOS devices
MIM Cap, HRES
Available I/O: I/O digital cell library
Standard cells database supports digital (front-end, backend and mixed-signal OA) design flows
Temp. range: -40° C. / +125° C
Thin gate oxide for the 1.2 V and a thick oxide for a 3.3 V supply voltage
Special features
Very high-performance RF technology
Application area
wireless and broadband communications
Frontend Backend tools
Cadence 6.1.8, ADS, AWR, TexEDA
Verification tools
PVS (Cadence)/Calibre (Siemens)
Parasitic extraction tools
ORC (Cadence)
Place route tools
Innovus (Cadence)
Libraries
Analog/ Standard Cell and IO digital libraries
Turnaround time
6 months
SG13SCU-BEOL
Technology characteristics
Met. layer(s): 8
4 thin metal layers (Cu)
2 thick metal layers (Cu)
1 thin aluminium layer for MIM
1 thick aluminium layer for bondpad
BiPolar, CMOS devices
MIM Cap, HRES
Available I/O: I/O digital cell library
Standard cells database supports digital (front-end, backend and mixed-signal OA) design flow
Temp. range: -40° C. / +125° C
Thin gate oxide for the 1.2 V and a thick oxide for a 3.3 V supply voltage
Special features
RF technology with the high performance, Improvement of passive components
Application area
wireless and broadband communications
Frontend Backend tools
Cadence 6.1.8, ADS
Verification tools
PVS (Cadence)/Calibre (Siemens)
Parasitic extraction tools
ORC (Cadence)
Place route tools
Innovus (Cadence)
Libraries
Analog/ Standard Cell and IO digital libraries
Turnaround time
6 months
SG13G2CU-BEOL
Technology characteristics
Met. layer(s): 8
4 thin metal layers (Cu)
2 thick metal layers (Cu)
1 thin aluminium layer for MIM
1 thick aluminium layer for bondpad
BiPolar, CMOS devices
MIM Cap, HRES
Available I/O: I/O digital cell library
Standard cells database supports digital (front-end, backend and mixed-signal OA) design flow
Temp. range: -40° C. / +125° C
Thin gate oxide for the 1.2 V and a thick oxide for a 3.3 V supply voltage
Special features
RF technology with very high performance, Improvement of passive components
Application area
wireless and broadband communications
Frontend Backend tools
Cadence 6.1.8, ADS
Verification tools
PVS (Cadence)/Calibre (Siemens)
Parasitic extraction tools
ORC (Cadence)
Place route tools
Innovus (Cadence)
Libraries
Analog/ Standard Cell and IO digital libraries
Turnaround time
6 months
SG13G3CU-BEOL
Technology characteristics
Met. layer(s): 8
4 thin metal layers (Cu)
2 thick metal layers (Cu)
1 thin aluminium layer for MIM
1 thick aluminium layer for bondpad
BiPolar, CMOS devices
MIM Cap, HRES
Standard cells database supports digital (front-end, backend and mixed-signal OA) design flow
Temp. range: -40° C. / +125° C
Thin gate oxide for the 1.2 V and a thick oxide for a 3.3 V supply voltage
Special features
RF technology with the highest bipolar performance, Improvement of passive components
Application area
wireless and broadband communications
Frontend Backend tools
Cadence 6.1.8, ADS
Verification tools
PVS (Cadence)/Calibre (Siemens)
Parasitic extraction tools
ORC (Cadence)
Place route tools
Innovus (Cadence)
Libraries
Analog/digital
Turnaround time
7 months
SG13G3
Technology characteristics
Met. layer(s): 7
5 thin metal layers, 2 thick metal layers
BiPolar, CMOS devices
MIM Cap, poly silicon resistors
Available I/O: I/O digital cell library
Standard cells database supports digital (front-end, backend and mixed-signal OA) design flows
Temp. range: -40° C. / +125° C
Thin gate oxide for the 1.2 V and a thick oxide for a 3.3 V supply voltage
Special features
BiCMOS technology with very high bipolar performance
Application area
wireless and broadband communications
Frontend Backend tools
Cadence 6.1.8, ADS
Verification tools
PVS (Cadence)/Calibre(Siemens)
Parasitic extraction tools
QRC (Cadence)
Place route tools
Innovus (Cadence)
Libraries
Analog/Standard Cell and IO digital libraries
Turnaround time
7 months
SG25H7_EPIC
Technology characteristics
Met. layer(s): 5
3 thin metal layers, 2 thick metal layers
BiPolar, CMOS devices, high-responsivity Ge photodiodes
MIM Cap, HRES, passive photonic components
Available I/O: I/O digital cell library
Standard cells database supports digital (front-end, backend and mixed-signal OA) design flow
Temp. range: -40° C. / +125° C
Thin gate oxide for the 1.2 V and a thick oxide for a 3.3 V supply voltage
Special features
Monolithic photonic BiCMOS technology combining RF-MOS, high-performance HBTs and full photonic device set for C/O-band. Enabling the fabrication of electronic-photonic integrated circuit. High RF passive component performance
Application area
Optical communication systems, Broadband communications
Frontend Backend tools
Cadence 6.1.8, ADS, IPKISS, Tanner,TexEDA
Verification tools
PVS (Cadence)/Calibre(Siemens)
Parasitic extraction tools
QRC (Cadence)/XRC
Place route tools
Innovus (Cadence)
Libraries
Analog/ digital 3.3V I/O and standard library
Turnaround time
9 months
Graphene
Technology characteristics
IHP focuses on the development of graphene photonic integrated circuits (PIC) in a 200 mm pilot line. More details can be found here:
https://europractice-ic.com/technologies/graphene/ihp-graphene/
https://graphene-flagship.eu/industrialisation/pilot-line/2d-pl-support-programme
Special features
Fabrication of Graphene photonic devices in 200 mm BiCMOS pilot line with tailored processes. Graphene-based PICs combined with embedded SiN waveguides.
Application area
Testing of diverse components for advanced high-speed communication, optical computing, etc. systems. Creation of ultra-thin and lightweight components, enabling the development of faster and more efficient electronic devices. Application fields in healthcare, environmental monitoring, and consumer electronics
Design tools
Klayout, TeXeda
Verification tools
Klayout, TeXeda DRC
Libraries
Preliminary device libraries including waveguide, grating coupler, modulator performances
Turnaround time
4 – 5 months